Mode Interference Effect in Coherent Electron Focusing
نویسندگان
چکیده
منابع مشابه
Coherent electron interference from amorphous TEM specimens.
For the first time, the electron intensity on the diffraction plane from amorphous transmission electron microscope (TEM) specimens has been found to have sufficient coherence to produce fringes in interferograms that were created using a wavefront splitting method of diffracted beam interferometry. The fringes were found to exist from low to high electron-scattering angles. Their spatial frequ...
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P. Rakyta,1 A. Kormányos,2,* J. Cserti,1 and P. Koskinen3 1Department of Physics of Complex Systems, Eötvös University, Pázmány Péter sétány 1/A, H-1117 Budapest, Hungary 2Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom 3Department of Physics, NanoScience Center, 40014 University of Jyväskylä, Finland Received 9 September 2009; revised manuscript received 16 Decem...
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ژورنال
عنوان ژورنال: Europhysics Letters (EPL)
سال: 1988
ISSN: 0295-5075,1286-4854
DOI: 10.1209/0295-5075/7/4/013